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Defects in SiO2 and Related Dielectrics: Science and Technology - NATO Science Series II Softcover reprint of the original 1st ed. 2000 edition
Gianfranco Pacchioni
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Defects in SiO2 and Related Dielectrics: Science and Technology - NATO Science Series II Softcover reprint of the original 1st ed. 2000 edition
Gianfranco Pacchioni
Proceedings of the NATO Advanced Study Institute, Erice, Italy, April 8-20, 2000
624 pages, 87 black & white illustrations, biography
| Media | Bøker Pocketbok (Bok med mykt omslag og limt rygg) |
| Utgitt | 31. desember 2000 |
| ISBN13 | 9780792366867 |
| Utgivere | Springer |
| Antall sider | 624 |
| Mål | 153 × 234 × 20 mm · 875 g |
| Språk | Engelsk |
| Redaktør | Griscom, David L. |
| Redaktør | Pacchioni, Gianfranco |
| Redaktør | Skuja, Linards |
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