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Field-Ion Microscopy - Crystals Softcover reprint of the original 1st ed. 1982 edition
R. Wagner
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Field-Ion Microscopy - Crystals Softcover reprint of the original 1st ed. 1982 edition
R. Wagner
Despite the recent progress in developing various microanalytical tools of better spatial resolution and more sensitivity to chemical analyses for the study of various defects in metallic solids the Field-Ion Microscope (FIM) still remains the only instrument up to now to resolve single atoms in the surface of a metal.
134 pages, biography
| Media | Bøker Pocketbok (Bok med mykt omslag og limt rygg) |
| Utgitt | 7. desember 2011 |
| ISBN13 | 9783642686894 |
| Utgivere | Springer-Verlag Berlin and Heidelberg Gm |
| Antall sider | 118 |
| Mål | 170 × 244 × 7 mm · 226 g |
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